Abstract: In response to the issue of poor detection performance on wafer surface defect spots and elongated scratches, an improved RT-DETR method for wafer surface defect detection is proposed.
Taiwan's semiconductor materials sector delivered a mixed performance in December 2025, highlighting a widening gap between advanced and mature segments of the supply chain. Upstream silicon wafer ...
Abstract: Wafer mappings (WM) help diagnose low-yield issues in semiconductor production by offering vital information about process anomalies. As integrated circuits continue to grow in complexity, ...
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