Atomic force microscopy (AFM) is an advanced microscopy technique that enables researchers to characterize the surface features of nanoparticles as small as 6 nm across. Image Credit: sanjaya viraj ...
A multimodal imaging study combines cryo-X-ray nanotomography and super-resolution fluorescence microscopy to reveal how protein-coated nanoparticles behave in cells. (Nanowerk Spotlight) The ...